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Bluetooth low-energy RF test solution speeds development of devices based on Texas Instruments ICs

Bluetooth low-energy RF test solution speeds development of devices based on Texas Instruments ICs

Agilent Technologies Inc. announces that its Bluetooth low-energy test solution on the N4010A wireless connectivity test set has been verified by Texas Instruments Inc. (TI) for use with TI's integrated circuits in Bluetooth Smart and Smart-Ready devices. The Bluetooth low-energy Tx/Rx test capability on N4010A gives manufacturers and design houses reliable and efficient test solutions for single-mode and dual-mode devices.

Bluetooth low-energy technology enables long operational life with minimal power consumption for applications such as mobile communications, sports and fitness, health care, security, and home entertainment.

Agilent's N4010A supports TI's system-on-chips and combo-connectivity solutions. TI delivers flexible, cost-effective Bluetooth low-energy solutions for Bluetooth Smart (single-mode) sensor applications and Bluetooth Smart-Ready (dual-mode) mobile applications, including the WiLink family. TI's WL128x solution, which is part of the WiLink 7.0 family, integrates mobile Wi-Fi, GPS, Bluetooth, Bluetooth low energy, ANT+, and FM transmit/receive connectivity technologies on a true single chip.

The N4010A wireless connectivity test set delivers a versatile multi-format test solution for WLAN a/b/g/n, Bluetooth 1.1 and 1.2, Bluetooth 2.1+Enhanced Data Rate, Bluetooth Audio, Bluetooth low energy, and ZigBee applications. It covers the product lifecycle from development and integration through production.

Bluetooth low-energy Tx/Rx option 109 is compliant with the latest Bluetooth 4.0 core specification for RF test requirements. The solution simplifies the process of creating test cases and increases manufacturing throughput with fast and accurate measurements.

For more information, contact Agilent Technologies Inc., 5301 Stevens Creek Blvd., Santa Clara, CA 95051. Phone: (877) 424-4536.

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