Texas Instruments introduced a family of high-reliability power management ICs and advanced CMOS (AC) logic devices to increase system-level reliability in applications exposed to long-term radiation and extreme temperatures, such as downhole drilling, x-ray imaging, satellite systems and high-altitude avionics. The new UC18xx pulse width modulation (PWM) controllers for switching power supply-based applications, plus the new UC1525B-SP offer improved rate sensitivity, allowing for greater than 30 krad(Si) tolerance to low dose rate radiation. In addition, three new parts in TI's SN54ACxx AC logic family reach a total irradiated dose (TID) level of 50 krad(Si) to allow for lower leakage current and improved radiation performance.
- UC18xx-SP devices achieve greater than 30 krad(Si) tolerance to low dose rate irradiation and provide up to 500-KHz voltage/current mode pulse width modulation control.
- UC1525B-SP offers a dual output, 250-kHz voltage mode PWM controller.
- SN54ACxx-SP devices reach up to 50 krad(Si) of TID levels of radiation and offer quadruple 2-input positive-NOR and NAND gates.
- Increase long-term system-level reliability up to 30 percent based on low dose radiation effects.
- Reduce expensive repairs, replacement costs and maintenance requirements for critical applications.
- Higher "critical mission" life rating; improved devices meet 10- to 15-year requirement for satellite mission lifetimes.
- Fewer incoming inspection/testing criteria and less system-level shielding requirements.