Agilent Technologies Inc. expanded its mixed-signal and digital-storage oscilloscope portfolio with four new 100-MHz models in the InfiniiVision 7000 Series. The 7000 Series now offers bandwidths from 100 MHz to 1 GHz and delivers an unparalleled deep-memory waveform update rate of up to 100,000 waveforms per second. Each new model is equipped with the largest screen available in a 100-MHz scope -- a 12.1-inch XGA LCD display - and comes in a package that is just 7 inches deep and weighs only 14 pounds.
The ability to consistently view subtle signal details and infrequent events allows designers to more quickly debug and test their electronic devices. Agilent's InfiniiVision 7000 Series oscilloscopes deliver the best signal visibility for designs that include analog and digital or serial signals. The combination of large-screen and mixed-signal capability for logic and protocol display previously was not available to designers who require scopes with only 100 MHz bandwidth.
The new 100-MHz models have the largest displays in their class. All InfiniiVision 7000 Series models are equipped with 12.1-inch displays, which give designers nearly 40 percent more display area than any other scope in this class. The increased display size helps users who need to display up to 20 channels simultaneously with serial protocol.
The 100-MHz models join the rest of the InfiniiVision 7000 Series in providing the industry's fastest update rate -- up to 100,000 waveforms per second - which eliminates unresponsive controls when deep memory is turned on. For designs with both digital and analog signal measurements, the 7000 Series' update rate is 5,000 times faster than that of any other available scope. This fast update rate allows designers to view critical signal details that competitive scopes miss because of their longer dead times.
Most comprehensive suite of applications: InfiniiVision 7000 Series oscilloscopes can be customized with a number of unique software options. Supported applications give engineers meaningful insight into application-specific problems.