Power Electronics

Power Conference Will Tackle Design Challenges Facing Military, Medical and Other Areas

As planning for next year’s Power Electronics Technology Conference and Exhibition gains momentum, conference planners are looking to expand the scope of the conference. This year’s event, which will run October 25-27 in Baltimore, will grow by addressing challenges facing developers of military power supplies, medical power electronics and power solutions for RF/microwave systems. Each of these topics will be addressed in new technical sessions. In addition, there will be areas within the exhibit devoted to each of these topics to provide attendees with a chance to view demonstrations of the power products developed to serve the military, medical and RF/microwave markets.

Conference organizers have issued a call for papers. In addition to the new topics already mentioned, papers are sought on topics such as power supply design and power management; systems design and integration; power electronics components; motor drives; and emerging applications.

For a full list of subtopics, go to www.powersystems.com, click on the Power Electronics Technology logo and then click on the “Become a Speaker” link. Next, locate the description “Submission information” and click on the link for “track,” which will call up a list of various subcategories being addressed in the conference. The “Become a Speaker” page also describes how to submit an abstract online. The deadline for submissions is April 5, 2005. Potential applicants should note that all speakers gain free admission to the conference.

The Power Electronics Technology 2005 Conference will be held in conjunction with the Power Quality 2005 Conference. The combination of these two technical conferences creates PowerSystems World 2005. These combined conferences create a large event that covers subjects ranging from fundamental electronic components to large facility systems with power ratings in the megawatts, to the implications and effects of energy management and reliability.

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